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Scanning probe microscopy
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271 $Electron microscope / Centre for Advanced Microscopy / Microscope / Microscopy / Scanning electron microscope / Transmission electron microscopy / Scanning probe microscopy / Electron backscatter diffraction / Focused ion beam / Scientific method / Science / Electron microscopy$	SYDNEY AUSTRALIAN CENTRE FOR & MICROSCOPY MICROSCOPY & MICROANALYSIS Add to Reading List Source URL: sydney.edu.au Language: English - Date: 2014-06-04 22:42:49 Electron microscope Centre for Advanced Microscopy Microscope Microscopy Scanning electron microscope Transmission electron microscopy Scanning probe microscopy Electron backscatter diffraction Focused ion beam Scientific method Science Electron microscopy
272	Team creates MRI for the nanoscale Add to Reading List Source URL: phys.org Language: English - Date: 2015-04-17 12:09:07 Magnetic resonance imaging Scanning probe microscopy Magnetism Magnet Resonance Atomic force microscopy Crystallographic defects Physics Electromagnetism Science
273	Measuring Boltzmann’s constant with a low-cost atomic force microscope: An undergraduate experiment M. Shusteff, T. P. Burg, and S. R. Manalisa兲 Biological Engineering Division, Massachusetts Institute of Technolog Add to Reading List Source URL: manalis-lab.mit.edu Language: English - Date: 2011-02-10 14:18:34 Chemistry Nanotechnology Intermolecular forces Atomic force microscopy Cantilever Microscopy Resonance Science Scientific method Scanning probe microscopy
274	APPLIED PHYSICS LETTERS VOLUME 75, NUMBER[removed]NOVEMBER 1999 Add to Reading List Source URL: manalis-lab.mit.edu Language: English - Date: 2011-02-10 14:18:35 Carbon nanotube Chemistry Scanning tunneling microscope Atomic force microscopy Scanning probe microscopy Scientific method Science
275 $Nanotechnology / Spectroscopy / Surface chemistry / Cantilever / Structural system / Scanning probe microscopy / Streptavidin / Diffraction / Biosensor / Science / Chemistry / Physics$	APPLIED PHYSICS LETTERS VOLUME 83, NUMBER 8 25 AUGUST 2003 Add to Reading List Source URL: manalis-lab.mit.edu Language: English - Date: 2011-02-10 14:18:34 Nanotechnology Spectroscopy Surface chemistry Cantilever Structural system Scanning probe microscopy Streptavidin Diffraction Biosensor Science Chemistry Physics
276	Applied Surface Science 144–145 Ž[removed]–579 Tunneling spectroscopy of bound and resonant states in superconducting proximity structures Y. Levi a , O. Millo a Add to Reading List Source URL: www.yale.edu Language: English - Date: 2005-10-11 16:19:06 Microscopes Scanning probe microscopy Scanning tunneling microscope Andreev reflection Resonance Physics Matter Superconductivity
277	Cantilever Sensors: Nanomechanical Tools for Diagnostics Ram Datar, Seonghwan Kim, Sangmin Jeon, Add to Reading List Source URL: manalis-lab.mit.edu Language: English - Date: 2011-02-10 14:18:36 Structural system Scanning probe microscopy Nanotechnology Cantilever Surface chemistry Atomic force microscopy Surface stress Deflection Piezoresistive effect Chemistry Science Physics
278	Fabrication and characterization of a micromechanical sensor for differential detection of nanoscale motions - Microelectromechanical Systems, Journal of Add to Reading List Source URL: manalis-lab.mit.edu Language: English - Date: 2011-02-10 14:18:35 Scanning probe microscopy Microtechnology Nanotechnology Cantilever Structural system Atomic force microscopy Microelectromechanical systems Silicon nitride Microsystem Materials science Science Chemistry
279	Experimental and theoretical results of room-temperature single-electron transistor formed by the atomic force microscope nano-oxidation process* Y. Gotoh,a) K. Matsumoto, and T. Maeda Electrotechnical Laboratory MITI, 1 Add to Reading List Source URL: manalis-lab.mit.edu Language: English - Date: 2011-02-10 14:18:35 Materials science Intermolecular forces Chemistry Emerging technologies Atomic force microscopy Carbon nanotube Coulomb blockade Cantilever Scanning probe microscopy Nanotechnology Science
280	APPLIED PHYSICS LETTERS VOLUME 85, NUMBER[removed]OCTOBER 2004 Add to Reading List Source URL: manalis-lab.mit.edu Language: English - Date: 2011-02-10 14:18:34 Chemistry Atomic force microscopy Scanning tunneling microscope Microscopy Microscope Sensor Nanotechnology Scanning probe microscopy Science Scientific method

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